• Techline Korea Co., Ltd.

  • A-1803, 184, Jungbu-daero, Giheung-gu, Yongin-si, Gyeonggi-do, Korea
  • EMAIL : sjlee@techline.co.kr
  • COPYRIGHT©
    Techline Korea Co., Ltd.
    All RIGHTS RESERVED.

Analysis

FIB Analysis and Circuit Modification

Circuit restoration and FIB analysis using FIB are important technical services for chip design.

▶ Inquiry/Request for Analysis : sjlee@techline.co.kr

 

We provide the various FIB services that customers need.

 

 

Precision Cutting

TEM Sample Preparation

IC Circuit Editing and Verification

Abnormal Process Analysis

Ion Channeling Contrast for Grain Morphology Observation

Auto-Navigation to Designated Failure Address

Passive Voltage Contrast Analysis for Fault Isolation

 

 

- (a) FIB circuit repair

- (b) Sn Whisker cutting

- (c) Cross-section observation of Pb-Sn Solder

- (d) Cross-section observation of a sample

 

 

- (a) Cross-section observation of a sample

- (b) FIB IC circuit repair

- (c) Cross-section observation under a solder ball

- (d) IC abnormality observation

 

 

- (a) Grain analysis/observation

- (b) Cross-section observation

- (c) FIB IC circuit repair

- (d) Cross-section observation of a PCB board

 

 

- (a) Probing pad

- (b) Big-area cross-section observation;

- (c) Cross-section observation after FIB circuit repair