Circuit restoration and FIB analysis using FIB are important technical services for chip design.
▶ Inquiry/Request for Analysis : sjlee@techline.co.kr
We provide the various FIB services that customers need.
Precision Cutting
TEM Sample Preparation
IC Circuit Editing and Verification
Abnormal Process Analysis
Ion Channeling Contrast for Grain Morphology Observation
Auto-Navigation to Designated Failure Address
Passive Voltage Contrast Analysis for Fault Isolation
- (a) FIB circuit repair
- (b) Sn Whisker cutting
- (c) Cross-section observation of Pb-Sn Solder
- (d) Cross-section observation of a sample
- (a) Cross-section observation of a sample
- (b) FIB IC circuit repair
- (c) Cross-section observation under a solder ball
- (d) IC abnormality observation
- (a) Grain analysis/observation
- (b) Cross-section observation
- (c) FIB IC circuit repair
- (d) Cross-section observation of a PCB board
- (a) Probing pad
- (b) Big-area cross-section observation;
- (c) Cross-section observation after FIB circuit repair